tracegrain

SURFACE METROLOGY / REFERENCE SYSTEM

Make surface analysis easier to trust.

Tracegrain is being built as an internet-based reference system for surface-texture analysis. Its purpose is to help teams compare filtering and parameter calculations against consistent examples.

Professional access · $500 USD per year. Covers published reference data and analysis tools for up to five named users, with 100 profile or surface-grid analyses per seat each calendar month. See the plan details

IN DEVELOPMENT · FOR COMPANIES, UNIVERSITIES, INSTRUMENT MAKERS AND RESEARCHERS

PROFILE COMPARISONTG / VISUAL 01
Illustrative surface profile comparisonAbstract profile traces over a fine measurement grid. This is a conceptual visualization, not measured data.SCAN POSITIONSURFACE HEIGHTPROFILE VIEW
Profile traceComparison trace
Concept visualization · no measurement values
REFERENCE DATA·ALGORITHM CHECKS·PARAMETER COMPARISON·2D + 3D VISUALIZATION

01 / THE NEED

One surface can produce different answers.

Instruments and analysis packages can process the same surface in different ways. A shared reference makes it easier to compare filters, parameter calculations and software behavior across teams.

A common basis for comparison, from raw profile to calculated parameter.

02 / THE TOOLSET

From surface data to a clearer comparison.

Explore reference profiles, analyze suitable inputs, and inspect the steps behind a result.

01

Reference datasets

FIND A CONSISTENT EXAMPLE

Planned as a searchable catalog of raw and processed profiles with calculated reference parameters, queryable by instrument, process, filename, part or measurement date.

02

Profile analysis

INSPECT THE METHOD

Planned analysis includes detrending and Gaussian or 2RC filtering to examine waviness, roughness and primary profiles, then calculate supported surface parameters.

03

Visual tools

SEE THE SURFACE

Planned views include 2D profiles and suitable 3D topographic data. Quantitative image analysis depends on the height and scale information supplied.

04

Advanced analysis

LOOK BEYOND A SINGLE VALUE

Planned methods include power spectral density, cross-correlation and auto-correlation where the input data and calculation method support them.

03 / WHO IT'S FOR

A shared reference across the measurement ecosystem.

01

Instrument manufacturers

Compare software implementations during development and support.

02

Software teams

Check filtering and parameter calculations against consistent profiles.

03

Researchers & universities

Work with consistent examples when studying surface-texture methods.

A CLEAR SCOPE

Reference comparisons support validation work. They do not certify standards compliance.

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